GSR_C2 Test Sample 

The GSR_C2 test sample described here is intended for daily use and supports compliance with section 9.2 of the ASTM E1588-25 standard, which requires a positive control before each automated analysis/case sample. Thanks to the compact single field layout of the particles, the measurement requires very little additional time (2–10 min per case sample depending on SEM and analysis parameters).

To avoid blocking any additional measurement positions on the SEM stage, the sample is supplied together with all necessary standards in a ½” stub:

• EDS standard for measuring the EDS resolution (Mn/Ni alloy 88/12)
• EDS detector calibration (Al-Cu)
• Faraday cup for beam current measurement
• Compact single-field QM test matrix with labelled particle-size rows, designed for fast daily detection-sensitivity checks before each case sample

It complements other standards that qualify and validate the entire SEM/EDS system for GSR applications. The results of the measurement of the new test matrix prior to each case sample measurement document the sensitivity and measurement readiness of the system for case work.

GSR_C2 is a variant of GSR_C1, omitting the Al-Ti-Mo and Co components for systems that use Al-Cu calibration instead.

Click to download technical documentation

Can be mounted on these SEM brands:
FEI / Thermo Fisher, Hitachi*, JEOL*, Phenom, Tescan and Zeiss microscopes.

• Product number: Stub_GSR_C2
• Price per unit: € 980 excl. VAT

*Requires a pin stub adapter