SEM/EDS Calibration and Reference Standards for Electron Microscopy
Periodic Today manufactures calibration standards, reference standards and custom embedded samples for SEM/EDS quality control, X-ray microanalysis, particle analysis and laboratory method development.
Our products undergo quality control procedures in our laboratory and are compatible with renowned SEM brands such as FEI / Thermo Fisher, Hitachi, JEOL, Phenom, Tescan and Zeiss microscopes.
If your SEM brand is not listed, please don’t hesitate to contact us through our contact page. We offer customized standards tailored to meet your specific requirements.
Our calibration standards are a collection of reference materials, consisting of elements or compounds, designed for various calibration tasks. These standards are a vital component for calibration, resolution testing, and performance testing of your imaging and analytical EDS system.
Reference standards consist of compounds and minerals, used to test several aspects of the analytical X-ray system. Such as (auto) peak ID, peak deconvolution, quantification, and EDS window properties.
Tailored sample solutions designed to meet your specific research and analytical needs. Our offerings include elements rom almost the entire periodic table, as well as custom compounds like Tin balls, Critical Dimension chips, or Gold on Carbon resolution test samples.