Al-Ti-Mo BSD & EDS sample
Aluminum, Titanium and Molybdenum are embedded in a 12.5mm aluminum pin stub. The materials are embedded close together to allow observation within one SEM field of view of approximately 500 µm. The sample is polished to 0.5 µm surface finish and coated with a 10 nm carbon layer.
Can be mounted on these SEM brands:
FEI / Thermo Fisher, Hitachi*, JEOL*, Phenom, Tescan and Zeiss microscopes.
- Product number: STUB_42
- Price per unit: € 340 excl. VAT
*Requires a pin stub adapter


