3-element EDS and BSD calibration sample

The sample offers distinct surfaces of aluminum (Al), copper (Cu), and vitreous carbon (C), as well as all material interfaces between these elements Al-Cu, Al-C, and Cu-C. Additionally, all three elements — Al, Cu and C — are present within a single field of view at two separate locations on the sample.

This sample was specially developed for use in Perception Automated Particle Analysis but is also suitable for other types of calibration or research applications. It allows for auto video setting (contrast brightness) of the Backscattered Electron Detector (BSD) to make particle detection threshold settings reproducible for various particle analysis applications. Cu can be used for automated EDS calibration within the software.

Can be mounted on these SEM brands:
FEI / Thermo Fisher, Hitachi*, JEOL*, Phenom, Tescan and Zeiss microscopes.

• Product number: Al-Cu-C
• Price per unit: € 260 excl. VAT

*Requires a pin stub adapter