Multi-calibration sample 25.4mm

A compact 25.4 mm multi-calibration sample containing:

• Au-C resolution test <250nm
• Sn balls for adjusting astigmatism
• Cu aperture, as Faraday cup and Al-Cu interface for EDS calibration
• CMDS for magnification calibration
• Mn-Ni alloy for EDS resolution measurement (Mn Kα)
• Above elements are embedded in a 25.4 aluminum pin stub

Can be mounted on these SEM brands:
FEI / Thermo Fisher, Hitachi*, JEOL*, Phenom, Tescan and Zeiss microscopes.

• Product number: Stub_45
• Price per unit: € 800 excl. VAT

*Requires a pin stub adapter